1 INTRODUCTION
1.1 Study Assumptions and Market Definition
1.2 Scope of the Study

2 RESEARCH METHODOLOGY

3 EXECUTIVE SUMMARY

4 MARKET INSIGHTS
4.1 Market Overview
4.2 Industry Attractiveness - Porter's Five Forces Analysis
4.2.1 Bargaining Power of Suppliers
4.2.2 Bargaining Power of Buyers
4.2.3 Threat of New Entrants
4.2.4 Threat of Substitutes
4.2.5 Intensity of Competitive Rivalry
4.3 Assessment of Impact of Covid-19 on the Market

5 MARKET DYNAMICS
5.1 Market Drivers
5.1.1 Increasing Demand for High Performance, Low-cost Semiconductors
5.1.2 Increasing Demand for Semiconductor Wafers in Consumer Electronics
5.2 Market Restraints
5.2.1 High Setup Cost and Lack of Expertise in Handling Metrology Systems Efficiently

6 MARKET SEGMENTATION
6.1 By Type
6.1.1 Lithography Metrology
6.1.1.1 Overlay
6.1.1.2 Dimension Equipment
6.1.1.3 Mask Inspection and Metrology
6.1.2 Wafer Inspection
6.1.3 Thin Film Metrology
6.1.4 Other Process Control Systems
6.2 By Geography
6.2.1 North America
6.2.2 Europe
6.2.3 Asia Pacific
6.2.4 Rest of the World

7 COMPETITIVE LANDSCAPE
7.1 Company Profiles
7.1.1 KLA Corporation
7.1.2 Applied Materials Inc.
7.1.3 Onto Innovation Inc. (Rudolph Technologies Inc.)
7.1.4 Thermo Fisher Scientific Inc.
7.1.5 Hitachi High-Tech Corporation
7.1.6 Nova Measuring Instruments Ltd
7.1.7 ASML Holding NV
7.1.8 Lasertec Corporation
7.1.9 JEOL Ltd.
7.1.10 Nikon Metrology NV
7.1.11 Camtek Limited

8 INVESTMENT ANALYSIS

9 FUTURE OF THE MARKET

Companies Mentioned
 - KLA Corporation
- Applied Materials Inc.
- Onto Innovation Inc. (Rudolph Technologies Inc.)
- Thermo Fisher Scientific Inc.
- Hitachi High-Tech Corporation
- Nova Measuring Instruments Ltd
- ASML Holding NV
- Lasertec Corporation
- JEOL Ltd.
- Nikon Metrology NV
- Camtek Limited